X-Ray Stress Measuring Technique for a Side-Wall of Deep Groove
Taizo OGURI, Kazuo MURATA and Katsumi YAMAGUCHI
Abstract:A new X-ray stress measuring technique - dual-axis inclining method - has been developed to measure stress on a flat surface at confined area like a side-wall of V-groove non-destructively. This technique allows one to measure two mutually orthogonal stress components of the side-wall - the normal stress in the groove-height direction T and that in the groove-line direction L - without eliminating a facing side-wall. This technique is characterized by the combination of the iso-inclination scanning (angle) and the side-inclination scanning (angle). The iso-inclination scanning in the plane including the groove-line leaving the side-wall inclined from the reference axis of goniometer's rotation, i.e. the rotation under 0deg, gives an apparent stress in the groove-line direction. Measuring the relation between the apparent stress and sin2 for available range on in which the X-ray path is not prevented by the facing side-wall, one can obtain L from the y-intercept by extrapolating the regression line of the relation to sin2=0 and T from the gradient of the regression line. The validity of this technique was verified by applying this technique and the conventional method to a flat specimen respectively, and comparing the values measured. Key Words:Groove, Confined area, Residual stress, Dual-axis inclining method, X-ray stress measurement, Non-destructive inspection