Vol. 58 No. 10 CONTENTS
Special Issue on Micromaterials
General Paper
Special Issue on Micromaterials (Vol.58 No.10)
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Foreword | |
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Y.Higo |
803 |
Review paper (Vol.58 No.10)
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International Standardization of Micro-Materials Evaluation Methods for MEMS Devices |
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Yakichi HIGO |
804 |
Original Paper (Vol.58 No.10)
Original Paper (Vol.58 No.10)
Translated Paper (Vol.58 No.10)
Lecture (Vol.58 No.10)
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Development of Materials Evaluation by Diffraction Method T.Residual Stress of Weld Section and X-Ray Residual Stress Measurement |
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Takayuki Kurimura and Yoshiaki AKINIWA |
873 |